• Designer's Guide to Testable Asic Devices

Designer's Guide to Testable Asic Devices

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Overview

While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact of ASIC testability on total system cost and performance, and reviews the commercial test systems that are currently available. Annotation copyrighted by Book News, Inc., Portland, OR

Product Details

ISBN-13: 9780442002213
ISBN-10: 0442002211
Publisher: Springer Science & Business Media
Publication date: 1991-01-10
Edition description: 1991
Pages: 284
Product dimensions: Height: 9 Inches, Length: 6 Inches, Weight: 2.9541943108 Pounds, Width: 0.81 Inches
Author: Wayne M. Needham
Language: en
Binding: Hardcover

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