This volume opens with a sweeping overview of the physical design of electronic systems-methodology, technology, and future challenges-thermally induced failures in electronic systems. Subsequent chapters examine the causes for thermally induced failures of electronic components and the techniques used to analyze and prevent such failures. It gives a comprehensive bibliograhy of project managers and lead engineers, packaging engineers and mechanical analysts, consultants, and academic, industrial, and government laboratory researchers.
| ISBN-13: | 9780791800188 |
| ISBN-10: | 0791800180 |
| Publisher: | American Society of Mechanical Engineers |
| Publication date: | 1993-12 |
| Edition description: | 1 |
| Pages: | 402 |
| Product dimensions: | Height: 9.5 Inches, Length: 6.25 Inches, Weight: 1.90038469844 Pounds, Width: 1 Inches |
| Author: | Allan D. Kraus |
| Language: | en |
| Binding: | Hardcover |
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