• Design for Manufacturability and Yield for Nano-Scale CMOS

Design for Manufacturability and Yield for Nano-Scale CMOS

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SKU SHUB154388
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Overview

This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.

Product Details

ISBN-13: 9781402051876
ISBN-10: 1402051875
Publisher: Springer
Publication date: 2007-08-24
Edition description: 2007
Pages: 254
Product dimensions: Height: 9.36 Inches, Length: 6.47 Inches, Weight: 1.322773572 Pounds, Width: 0.69 Inches
Author: Charles Chiang, Jamil Kawa
Language: en
Binding: Hardcover

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