• Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures

Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures

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SKU SHUB412639
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Overview

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

Product Details

ISBN-13: 9781441962164
ISBN-10: 1441962166
Publisher: Springer New York
Publication date: 2010-10-21
Pages: 195
Product dimensions: Height: 9.21 Inches, Length: 6.14 Inches, Weight: 1.97093262228 Pounds, Width: 0.56 Inches
Author: Miloš Stanisavljević, Alexandre Schmid, Yusuf Leblebici
Language: en
Binding: Hardcover

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