• Materials Reliability in Microelectronics II: Volume 265 (MRS Proceedings)

Materials Reliability in Microelectronics II: Volume 265 (MRS Proceedings)

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Overview

Book DescriptionThe MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Product Details

ISBN-13: 9781558991606
ISBN-10: 1558991603
Publisher: Cambridge University Press
Publication date: 1992-09-30
Edition description: 1
Pages: 346
Product dimensions: Height: 9 Inches, Length: 6 Inches, Weight: 1.3889122506 Pounds, Width: 6 Inches
Author: C. V. Thompson
Language: en
Binding: Hardcover

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