• Design and Test Technology for Dependable Systems-on-chip

Design and Test Technology for Dependable Systems-on-chip

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Overview

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.

Product Details

ISBN-13: 9781609602123
ISBN-10: 1609602129
Publisher: Information Science Reference
Publication date: 2011
Edition description: 1
Pages: 550
Product dimensions: Height: 11 Inches, Length: 8.5 Inches, Weight: 3.5494424182 Pounds, Width: 1.25 Inches
Author: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus
Language: en
Binding: Hardcover

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