Understanding the formation and introduction mechanisms of defects in semiconductors is essential to understanding their properties. Although many defect-related problems have been identified and solved over the past 60 years of semiconductor research, the quest for faster, cheaper, lower power, and new kinds of electronics generates an ongoing need for new materials and properties, and so creates new defect-related challenges.
| ISBN-13: | 9781785616556 |
| ISBN-10: | 1785616552 |
| Publisher: | Institution of Engineering and Technology |
| Publication date: | 2019-10-21 |
| Pages: | 600 |
| Product dimensions: | Height: 9.25 Inches, Length: 6.5 Inches, Weight: 2.4 Pounds, Width: 1.5 Inches |
| Author: | Filip Tuomisto |
| Language: | en |
| Binding: | Hardcover |
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