• Optical Imaging and Metrology Advanced Technologies

Optical Imaging and Metrology Advanced Technologies

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Overview

A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.

Product Details

ISBN-13: 9783527410644
ISBN-10: 3527410643
Publisher: John Wiley & Sons
Publication date: 2012-10-15
Edition description: 1
Pages: 502
Product dimensions: Height: 9.751949 Inches, Length: 6.901561 Inches, Weight: 2.3800444418734 Pounds, Width: 1.098423 Inches
Author: Wolfgang Osten, Nadya Reingand
Language: en
Binding: Hardcover

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