• New Horizons of Applied Scanning Electron Microscopy

New Horizons of Applied Scanning Electron Microscopy

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Overview

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

Product Details

ISBN-13: 9783642031595
ISBN-10: 3642031595
Publisher: Springer Berlin Heidelberg
Publication date: 2009-12-02
Pages: 182
Product dimensions: Height: 9.21 Inches, Length: 6.14 Inches, Weight: 1.10451593262 Pounds, Width: 0.5 Inches
Author: Kenichi Shimizu, Tomoaki Mitani
Language: en
Binding: Hardcover

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