• Computational Methods for Electromagnetic Phenomena Electrostatics in Solvation, Scattering, and Electron Transport

Computational Methods for Electromagnetic Phenomena Electrostatics in Solvation, Scattering, and Electron Transport

In stock (3 available)
SKU SHUB140370
$169 $113.68
Free Shipping within the US
Est. Date: Feb 1, 2026
Overview

A unique and comprehensive graduate text and reference on numerical methods for electromagnetic phenomena, from atomistic to continuum scales, in biology, optical-to-micro waves, photonics, nanoelectronics and plasmas. The state-of-the-art numerical methods described include: • Statistical fluctuation formulae for the dielectric constant • Particle-Mesh-Ewald, Fast-Multipole-Method and image-based reaction field method for long-range interactions • High-order singular/hypersingular (Nyström collocation/Galerkin) boundary and volume integral methods in layered media for Poisson-Boltzmann electrostatics, electromagnetic wave scattering and electron density waves in quantum dots • Absorbing and UPML boundary conditions • High-order hierarchical Nédélec edge elements • High-order discontinuous Galerkin (DG) and Yee finite difference time-domain methods • Finite element and plane wave frequency-domain methods for periodic structures • Generalized DG beam propagation method for optical waveguides • NEGF(Non-equilibrium Green's function) and Wigner kinetic methods for quantum transport • High-order WENO and Godunov and central schemes for hydrodynamic transport • Vlasov-Fokker-Planck and PIC and constrained MHD transport in plasmas

Product Details

ISBN-13: 9781107021051
ISBN-10: 1107021057
Publisher: Cambridge University Press
Publication date: 2013-01-03
Edition description: 1
Pages: 444
Product dimensions: Height: 10 Inches, Length: 7.25 Inches, Weight: 2.1384839414 Pounds, Width: 1.25 Inches
Author: Wei Cai
Language: en
Binding: Hardcover

Books Related to Mathematics

Discover more books in the same category

Customer Reviews

0.0 (0 reviews)
No Reviews Yet

Be the first to review this book!