A practical guide to incorporating computer-integrated testing (CIT) procedures into a computer-integrated manufacturing (CIM) line. Surveys the latest automated test equipment (ATE) and discusses how to integrate ATE into CIM in order to maximize benefits. Contains case studies in CIT, focusing on applications in the electronics industry.
| ISBN-13: | 9780471504863 |
| ISBN-10: | 0471504866 |
| Publisher: | Wiley-Interscience |
| Publication date: | 1989-05 |
| Edition description: | 1 |
| Pages: | 394 |
| Product dimensions: | Height: 9.4488 Inches, Length: 6.49605 Inches, Width: 0.98425 Inches |
| Author: | Buckroyd, Allen |
| Language: | en |
| Binding: | Paperback |
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