Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a
| ISBN-13: | 9780442006433 |
| ISBN-10: | 0442006438 |
| Publisher: | Springer US |
| Publication date: | 1993-08-31 |
| Pages: | 180 |
| Product dimensions: | Height: 9.21 Inches, Length: 6.14 Inches, Weight: 2.20462262 Pounds, Width: 0.5 Inches |
| Author: | Eugene R. Hnatek |
| Language: | en |
| Binding: | Hardcover |
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