• Electron and Ion Microscopy and Microanalysis Principles and Applications, Second Edition,

Electron and Ion Microscopy and Microanalysis Principles and Applications, Second Edition,

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Est. Date: Jan 7, 2026

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

  • Author(s): Lawrence E Murr
  • Publisher: Taylor & Francis
  • Language: en
  • Pages: 856
  • Binding: Hardcover
  • Edition: 2
  • Published: 1991-07-25
  • Dimensions: Height: 10.24 Inches, Length: 7.26 Inches, Weight: 3.52298694676 Pounds, Width: 1.76 Inches
  • Estimated Delivery: Jan 7, 2026
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