Integrating advances in instrumentation and methods, this work offers an approach to solving problems in surface and interface analysis, beginning with a particular problem and then explaining the most rational and efficient route to a solution. The book discusses electron optical and scanned probe microscopy, high spatial resolution imaging and synchrotron-based techniques. It emphasizes problem-solving for different classes of materials and material function.
| ISBN-13: | 9780824700805 |
| ISBN-10: | 0824700805 |
| Publisher: | CRC Press |
| Publication date: | 1998-01-27 |
| Edition description: | 1 |
| Pages: | 968 |
| Product dimensions: | Height: 9.5 Inches, Length: 6.5 Inches, Weight: 3.20111204424 Pounds, Width: 2 Inches |
| Author: | John C. Riviere, Sverre Myhra |
| Language: | en |
| Binding: | Hardcover |
Discover more books in the same category
