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  • Impurities, Defects and Diffusion in Semiconductors: Bulk and Layered Structures: Volume 163 (MRS Proceedings)

Impurities, Defects and Diffusion in Semiconductors: Bulk and Layered Structures: Volume 163 (MRS Proceedings)

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SKU SHUB170439
$46.35
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Est. Date: Feb 19, 2026
Overview

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Product Details

ISBN-13: 9781558990517
ISBN-10: 1558990518
Publisher: Cambridge University Press
Publication date: 1990-06-20
Edition description: Illustrated
Pages: 1086
Product dimensions: Height: 9 Inches, Length: 6 Inches, Weight: 3.527396192 Pounds, Width: 2.19 Inches
Author: Donald J. Wolford, Jerzy Bernholc, Eugene E. Haller
Language: en
Binding: Hardcover

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