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  • Impurities, Defects and Diffusion in Semiconductors: Bulk and Layered Structures: Volume 163 (MRS Proceedings)

Impurities, Defects and Diffusion in Semiconductors: Bulk and Layered Structures: Volume 163 (MRS Proceedings)

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Est. Date: Jan 26, 2026

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

  • Author(s): Donald J. Wolford, Jerzy Bernholc, Eugene E. Haller
  • Publisher: Cambridge University Press
  • Language: en
  • Pages: 1086
  • Binding: Hardcover
  • Edition: Illustrated
  • Published: 1990-06-20
  • Dimensions: Height: 9 Inches, Length: 6 Inches, Weight: 3.527396192 Pounds, Width: 2.19 Inches
  • Estimated Delivery: Jan 26, 2026
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