Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
| ISBN-13: | 9783527319732 |
| ISBN-10: | 3527319735 |
| Publisher: | John Wiley & Sons |
| Publication date: | 2012-05-29 |
| Edition description: | 1 |
| Pages: | 402 |
| Product dimensions: | Height: 9.700768 Inches, Length: 6.909435 Inches, Weight: 2.000033640864 Pounds, Width: 0.830707 Inches |
| Author: | Gerhard Dehm, James M. Howe, Josef Zweck |
| Language: | en |
| Binding: | Hardcover |
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