ISTFA 2004 Proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts

The 30th International Symposium for Testing and Failure Analysis (ISTFA 2004) was held November 2004 in Worcester, Massachusetts. Papers are arranged in sections on nanotechnology, advanced techniques, SPM techniques, package level analysis, die level fault isolation, optical techniques, MEMs, metrology and materials analysis, optoelectronic devices, sample preparation, and yield enhancement, among other topics. An appendix contains a paper offering a correction to a 2003 proceedings paper on ESD failure signature differences in the devices core logic and protection structures. There is no index, but the included CD-ROM presumable contains the contents in a searchable format. Annotation :2004 Book News, Inc., Portland, OR (booknews.com).