• Materials Reliability in Microelectronics II: Volume 265 (MRS Proceedings)

Materials Reliability in Microelectronics II: Volume 265 (MRS Proceedings)

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Est. Date: Jan 26, 2026

Book DescriptionThe MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

  • Author(s): C. V. Thompson
  • Publisher: Cambridge University Press
  • Language: en
  • Pages: 346
  • Binding: Hardcover
  • Edition: 1
  • Published: 1992-09-30
  • Dimensions: Height: 9 Inches, Length: 6 Inches, Weight: 1.3889122506 Pounds, Width: 6 Inches
  • Estimated Delivery: Jan 26, 2026
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