• Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers A Selection of Papers from the 9th International Symposium, Paris, France, 27 June-1 July 2005

Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers A Selection of Papers from the 9th International Symposium, Paris, France, 27 June-1 July 2005

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Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers contains a selection of papers presented at PASSIVITY-9, the 9th International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin Oxide Layers, which was held in Paris, 27 June - 1 July, 2005. One hundred and twelve peer-reviewed manuscripts have been included. The book covers all the fundamental and applied aspects of passivity and provides a relevant and updated view of the advances and new trends in the field. It is structured in ten sections: • Growth, (Nano)structure and Composition of Passive Films • Passivity of Semiconductors • Electronic Properties of Passive Films • Passivity Issues in Biological Systems • Passivity in High-Temperature Water • Mechanical Properties of Passive Films,• Passivity Issues in Stress Corrosion Cracking and Tribocorrosion • Passivity Breakdown and Localized Corrosion • Modeling and Simulation • Surface Modifications and Inhibitors (for Improved Corrosion Resistance and/or Adhesion)

  • Author(s): Philippe Marcus, Vincent Maurice
  • Publisher: Elsevier
  • Language: en
  • Pages: 747
  • Binding: Hardcover
  • Edition: 1
  • Published: 2006
  • Dimensions: Height: 9.21 Inches, Length: 6.14 Inches, Weight: 3.2628414776 Pounds, Width: 1.63 Inches
  • Estimated Delivery: Jan 3, 2026
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