• RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

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SKU SHUB226947
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Overview

This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based.

Product Details

ISBN-13: 9781891121890
ISBN-10: 1891121898
Publisher: Institution of Engineering and Technology
Publication date: 2010-06-30
Pages: 349
Product dimensions: Height: 9.2 Inches, Length: 6.2 Inches, Weight: 1.3 Pounds, Width: 0.9 Inches
Author: Jianjun Gao
Language: en
Binding: Hardcover

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