Self-Trapped Excitons discusses the structure and evolution of the self-trapped exciton (STE) in a wide range of materials. It includes a comprehensive review of experiments and extensive tables of data. Emphasis is given throughout to the unity of the basic physics underlying various manifestations of self-trapping, with the theory being developed from a localized, atomistic perspective. The topics treated in detail in relation to STE relaxation include spontaneous symmetry breaking, lattice defect formation, radiation damage, and electronic sputtering.
| ISBN-13: | 9783540604464 |
| ISBN-10: | 3540604464 |
| Publisher: | Springer |
| Publication date: | 1996-03-18 |
| Edition description: | Softcover reprint of the original 2nd ed. 1996 |
| Pages: | 424 |
| Product dimensions: | Height: 9.25 Inches, Length: 6.1 Inches, Weight: 1.4440278161 Pounds, Width: 0.97 Inches |
| Author: | K.S. Song, Richard T. Williams |
| Language: | en |
| Binding: | Paperback |
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