• Semiconductor Memories Technology, Testing, and Reliability

Semiconductor Memories Technology, Testing, and Reliability

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SKU SHUB116211
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Overview

This all-original book brings you in-depth coverage of the most vital microelectronic component of digital logic system design: semiconductor memory. Keeping pace with the explosive growth in submicron development, the author presents state-of-the-art information on semiconductor memory technology for both volatile and nonvolatile memory devices, including testing, reliability issues, and radiation effects. Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods. This book will be valuable to all industry professionals and students working with semiconductor memories, including those in computing, automotive, military, and aerospace fields.

Product Details

ISBN-13: 9780780311145
ISBN-10: 0780311140
Publisher: IEEE Press
Publication date: 1997
Pages: 462
Product dimensions: Height: 10.5 Inches, Length: 7.5 Inches, Width: 0.5 Inches
Author: Ashok K. Sharma
Language: en
Binding: Hardcover

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