• Structure Analysis of Advanced Nanomaterials Nanoworld by High-resolution Electron Microscopy

Structure Analysis of Advanced Nanomaterials Nanoworld by High-resolution Electron Microscopy

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SKU SHUB236105
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Overview

High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.

Product Details

ISBN-13: 9783110304725
ISBN-10: 3110304724
Publisher: De Gruyter
Publication date: 2014
Edition description: Digital original
Pages: 168
Product dimensions: Height: 9.61 Inches, Length: 6.69 Inches, Weight: 1.08687895166 Pounds, Width: 0.44 Inches
Author: Takeo Oku
Language: en
Binding: Hardcover

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