• Trap Level Spectroscopy in Amorphous Semiconductors

Trap Level Spectroscopy in Amorphous Semiconductors

Out of stock
SKU SHUB56767
$149.99 $115.61
Free Shipping within the US
Est. Date: Feb 16, 2026
Overview

Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most used spectroscopic techniques Discusses the advantages and disadvantages of each technique

Product Details

ISBN-13: 9780123847157
ISBN-10: 012384715X
Publisher: Elsevier
Publication date: 2010
Edition description: 1
Pages: 120
Product dimensions: Height: 9.01573 Inches, Length: 5.98424 Inches, Weight: 0.881849048 Pounds, Width: 0.3751961 Inches
Author: Victor I. Mikla, Victor V. Mikla
Language: en
Binding: Hardcover

Books Related to Science

Discover more books in the same category

Customer Reviews

0.0 (0 reviews)
No Reviews Yet

Be the first to review this book!