• X-Ray Diffraction Modern Experimental Techniques

X-Ray Diffraction Modern Experimental Techniques

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SKU SHUB263097
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Overview

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

Product Details

ISBN-13: 9789814303590
ISBN-10: 9814303593
Publisher: Pan Stanford
Publication date: 2015-02-10
Edition description: 1
Pages: 414
Product dimensions: Height: 9.5 Inches, Length: 6.75 Inches, Weight: 2.0502990366 Pounds, Width: 1.25 Inches
Author: Oliver H. Seeck, Bridget Murphy
Language: en
Binding: Hardcover

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